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Jan 27 06:25:16 kubbur-server kernel: [883984.163665] EXT4-fs (sdb1): previous I/O error to superblock detected
Jan 27 06:25:16 kubbur-server kernel: [883984.163733] Buffer I/O error on device sdb1, logical block 0
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kubbur@kubbur-server:~$ sudo smartctl --all /dev/sdb
smartctl 5.41 2011-06-09 r3365 [i686-linux-3.0.0-12-generic-pae] (local build)
Copyright (C) 2002-11 by Bruce Allen, http://smartmontools.sourceforge.net
=== START OF INFORMATION SECTION ===
Model Family: Western Digital Caviar Green
Device Model: WDC WD10EACS-14ZJB0
Serial Number: WD-WCASJ1978100
LU WWN Device Id: 5 0014ee 2ac9a5630
Firmware Version: 01.01B01
User Capacity: 1,000,203,804,672 bytes [1.00 TB]
Sector Size: 512 bytes logical/physical
Device is: In smartctl database [for details use: -P show]
ATA Version is: 8
ATA Standard is: Exact ATA specification draft version not indicated
Local Time is: Sat Jan 28 02:09:53 2012 GMT
SMART support is: Available - device has SMART capability.
SMART support is: Enabled
=== START OF READ SMART DATA SECTION ===
SMART overall-health self-assessment test result: PASSED
General SMART Values:
Offline data collection status: (0x00) Offline data collection activity
was never started.
Auto Offline Data Collection: Disabled.
Self-test execution status: ( 0) The previous self-test routine completed
without error or no self-test has ever
been run.
Total time to complete Offline
data collection: (27180) seconds.
Offline data collection
capabilities: (0x7b) SMART execute Offline immediate.
Auto Offline data collection on/off support.
Suspend Offline collection upon new
command.
Offline surface scan supported.
Self-test supported.
Conveyance Self-test supported.
Selective Self-test supported.
SMART capabilities: (0x0003) Saves SMART data before entering
power-saving mode.
Supports SMART auto save timer.
Error logging capability: (0x01) Error logging supported.
General Purpose Logging supported.
Short self-test routine
recommended polling time: ( 2) minutes.
Extended self-test routine
recommended polling time: ( 255) minutes.
Conveyance self-test routine
recommended polling time: ( 5) minutes.
SCT capabilities: (0x303f) SCT Status supported.
SCT Error Recovery Control supported.
SCT Feature Control supported.
SCT Data Table supported.
SMART Attributes Data Structure revision number: 16
Vendor Specific SMART Attributes with Thresholds:
ID# ATTRIBUTE_NAME FLAG VALUE WORST THRESH TYPE UPDATED WHEN_FAILED RAW_VALUE
1 Raw_Read_Error_Rate 0x000f 200 200 051 Pre-fail Always - 0
3 Spin_Up_Time 0x0003 225 177 021 Pre-fail Always - 5741
4 Start_Stop_Count 0x0032 096 096 000 Old_age Always - 4284
5 Reallocated_Sector_Ct 0x0033 200 200 140 Pre-fail Always - 0
7 Seek_Error_Rate 0x000e 100 253 051 Old_age Always - 0
9 Power_On_Hours 0x0032 071 071 000 Old_age Always - 21668
10 Spin_Retry_Count 0x0012 100 100 051 Old_age Always - 0
11 Calibration_Retry_Count 0x0012 100 100 051 Old_age Always - 0
12 Power_Cycle_Count 0x0032 098 098 000 Old_age Always - 2525
192 Power-Off_Retract_Count 0x0032 197 197 000 Old_age Always - 2754
193 Load_Cycle_Count 0x0032 199 199 000 Old_age Always - 5051
194 Temperature_Celsius 0x0022 107 098 000 Old_age Always - 45
196 Reallocated_Event_Count 0x0032 200 200 000 Old_age Always - 0
197 Current_Pending_Sector 0x0012 200 200 000 Old_age Always - 0
198 Offline_Uncorrectable 0x0010 100 253 000 Old_age Offline - 0
199 UDMA_CRC_Error_Count 0x003e 200 200 000 Old_age Always - 0
200 Multi_Zone_Error_Rate 0x0008 100 253 051 Old_age Offline - 0
SMART Error Log Version: 1
ATA Error Count: 152 (device log contains only the most recent five errors)
CR = Command Register [HEX]
FR = Features Register [HEX]
SC = Sector Count Register [HEX]
SN = Sector Number Register [HEX]
CL = Cylinder Low Register [HEX]
CH = Cylinder High Register [HEX]
DH = Device/Head Register [HEX]
DC = Device Command Register [HEX]
ER = Error register [HEX]
ST = Status register [HEX]
Powered_Up_Time is measured from power on, and printed as
DDd+hh:mm:SS.sss where DD=days, hh=hours, mm=minutes,
SS=sec, and sss=millisec. It "wraps" after 49.710 days.
Error 152 occurred at disk power-on lifetime: 10205 hours (425 days + 5 hours)
When the command that caused the error occurred, the device was active or idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
04 51 08 67 08 64 e0 Error: ABRT 8 sectors at LBA = 0x00640867 = 6555751
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
25 00 08 67 08 64 00 00 00:05:20.249 READ DMA EXT
25 00 08 67 08 64 00 00 00:05:19.250 READ DMA EXT
25 00 08 67 08 64 00 00 00:05:18.251 READ DMA EXT
25 00 08 67 08 64 00 00 00:05:17.252 READ DMA EXT
25 00 08 67 08 64 00 00 00:05:16.253 READ DMA EXT
Error 151 occurred at disk power-on lifetime: 10205 hours (425 days + 5 hours)
When the command that caused the error occurred, the device was active or idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
04 51 08 67 08 64 e0 Error: ABRT 8 sectors at LBA = 0x00640867 = 6555751
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
25 00 08 67 08 64 00 00 00:05:19.250 READ DMA EXT
25 00 08 67 08 64 00 00 00:05:18.251 READ DMA EXT
25 00 08 67 08 64 00 00 00:05:17.252 READ DMA EXT
25 00 08 67 08 64 00 00 00:05:16.253 READ DMA EXT
25 00 08 67 08 64 00 00 00:05:15.254 READ DMA EXT
Error 150 occurred at disk power-on lifetime: 10205 hours (425 days + 5 hours)
When the command that caused the error occurred, the device was active or idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
04 51 08 67 08 64 e0 Error: ABRT 8 sectors at LBA = 0x00640867 = 6555751
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
25 00 08 67 08 64 00 00 00:05:18.251 READ DMA EXT
25 00 08 67 08 64 00 00 00:05:17.252 READ DMA EXT
25 00 08 67 08 64 00 00 00:05:16.253 READ DMA EXT
25 00 08 67 08 64 00 00 00:05:15.254 READ DMA EXT
25 00 08 67 08 64 00 00 00:05:14.255 READ DMA EXT
Error 149 occurred at disk power-on lifetime: 10205 hours (425 days + 5 hours)
When the command that caused the error occurred, the device was active or idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
04 51 08 67 08 64 e0 Error: ABRT 8 sectors at LBA = 0x00640867 = 6555751
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
25 00 08 67 08 64 00 00 00:05:17.252 READ DMA EXT
25 00 08 67 08 64 00 00 00:05:16.253 READ DMA EXT
25 00 08 67 08 64 00 00 00:05:15.254 READ DMA EXT
25 00 08 67 08 64 00 00 00:05:14.255 READ DMA EXT
25 00 08 67 08 64 00 00 00:05:13.256 READ DMA EXT
Error 148 occurred at disk power-on lifetime: 10205 hours (425 days + 5 hours)
When the command that caused the error occurred, the device was active or idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
04 51 08 67 08 64 e0 Error: ABRT 8 sectors at LBA = 0x00640867 = 6555751
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
25 00 08 67 08 64 00 00 00:05:16.253 READ DMA EXT
25 00 08 67 08 64 00 00 00:05:15.254 READ DMA EXT
25 00 08 67 08 64 00 00 00:05:14.255 READ DMA EXT
25 00 08 67 08 64 00 00 00:05:13.256 READ DMA EXT
25 00 08 67 08 64 00 00 00:05:12.257 READ DMA EXT
SMART Self-test log structure revision number 1
Num Test_Description Status Remaining LifeTime(hours) LBA
# 1 Short captive Completed without error 00% 648 -
SMART Selective self-test log data structure revision number 1
SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS
1 0 0 Not_testing
2 0 0 Not_testing
3 0 0 Not_testing
4 0 0 Not_testing
5 0 0 Not_testing
Selective self-test flags (0x0):
After scanning selected spans, do NOT read-scan remainder of disk.
If Selective self-test is pending on power-up, resume after 0 minute delay.